Comprehensive Genomic Profiling Aids in Distinguishing Metastatic Recurrence from Second Primary Cancers.

Authors

Benjamin A Weinberg
Kyle Gowen
Thomas K Lee
Sai-Hong Ignatius Ou
Robert Bristow
Lauren Krill
M Isabel Almira-Suarez, George Washington UniversityFollow
Siraj M Ali
Vincent A Miller
Stephen V Liu
Samuel J Klempner

Document Type

Journal Article

Publication Date

2-1-2017

Journal

The oncologist

Volume

22

Issue

2

DOI

10.1634/theoncologist.2015-0511

APA Citation

Weinberg, B., Gowen, K., Lee, T., Ou, S., Bristow, R., Krill, L., Almira-Suarez, M., Ali, S., Miller, V., Liu, S., & Klempner, S. (2017). Comprehensive Genomic Profiling Aids in Distinguishing Metastatic Recurrence from Second Primary Cancers.. The oncologist, 22 (2). http://dx.doi.org/10.1634/theoncologist.2015-0511