Axonal debris accumulates in corneal epithelial cells after intraepithelial corneal nerves are damaged: A focused Ion Beam Scanning Electron Microscopy (FIB-SEM) study.

Authors

Paola Parlanti, George Washington University
Sonali Pal-Ghosh, George Washington University
Alexa Williams, George Washington University
Gauri Tadvalkar, George Washington University
Anastas Popratiloff, George Washington University
Mary Ann Stepp, George Washington University

Document Type

Journal Article

Publication Date

3-21-2020

Journal

Experimental Eye Research

Volume

194

DOI

10.1016/j.exer.2020.107998

Comments

Online ahead of print

APA Citation

Parlanti, P., Pal-Ghosh, S., Williams, A., Tadvalkar, G., Popratiloff, A., & Stepp, M. (2020). Axonal debris accumulates in corneal epithelial cells after intraepithelial corneal nerves are damaged: A focused Ion Beam Scanning Electron Microscopy (FIB-SEM) study.. Experimental Eye Research, 194 (). http://dx.doi.org/10.1016/j.exer.2020.107998

Peer Reviewed

1